International Journals

1. Calibration of Compact Resist Model Through CNN Training
   Yonghwi Kwon and Youngsoo Shin
   IEEE Transactions on Semiconductor Manufacturing (TSM), vol. 36, May 2023 (Link)

2. Integrated Test Pattern Extraction and Generation for Accurate Lithography Modeling (2022 IEEE TSM BPA - Honorable Mention)
   Gangmin Cho, Yonghwi Kwon, Pervaiz Kareem, and Youngsoo Shin
   IEEE Transactions on Semiconductor Manufacturing (TSM), vol. 35, Aug. 2022 (Link)

3. Optical Proximity Correction Using Bidirectional Recurrent Neural Network with Attention Mechanism (2021 IEEE TSM Best Paper Award)
   Yonghwi Kwon and Youngsoo Shin
   IEEE Transactions on Semiconductor Manufacturing (TSM), vol. 34, May 2021 (Link)

4. Layout Pattern Synthesis for Lithography Optimizations
   Pervaiz Kareem, Yonghwi Kwon, and Youngsoo Shin
   IEEE Transactions on Semiconductor Manufacturing (TSM), vol. 33, May 2020 (Link)

International Conference Proceedings

1. Multisource Clock Tree Synthesis Through Sink Clustering and Fast Clock Latency Prediction
   Byungho Choi, Yonghwi Kwon, Umar Afzaal, and Youngsoo Shin
   IEEE International Symposium on Circuits and Systems (ISCAS), May 2023 (to be published)

2. Fast Prediction of Dynamic IR-Drop Using Recurrent U-net Architecture
   Yonghwi Kwon and Youngsoo Shin
   ACM/IEEE Workshop on Machine Learning for CAD (MLCAD), Sep. 2022 (Link)

3. Matrix-OPC with Fast MEEF Prediction Using Artificial Neural Network
   Yonghwi Kwon and Youngsoo Shin
   SPIE Advanced Lithography, Apr. 2022 (Link)

4. Refragmentation Through Machine Learning Classifier For Fast and Accurate Optical Proximity Correction
   Gangmin Cho, Byungho Choi, Yonghwi Kwon, and Youngsoo Shin
   SPIE Advanced Lithography, Apr. 2022 (Link)

5. Hotspot Pattern Synthesis Using Generative Network with Hotspot Probability Model
   Byungho Choi, Gangmin Cho, Yonghwi Kwon, and Youngsoo Shin
   SPIE Advanced Lithography, Apr. 2022 (Link)

6. Dynamic IR Drop Prediction Using Image-To-Image Translation Neural Network
   Yonghwi Kwon, Daijoon Hyun, Giyoon Jung, and Youngsoo Shin
   IEEE International Symposium on Circuits and Systems (ISCAS), May 2021 (Link)

7. Test Pattern Extraction for Lithography Modeling Under Design Rule Revisions
   Gangmin Cho, Yonghwi Kwon, Pervaiz Kareem, Sungho Kim, and Youngsoo Shin
   SPIE Advanced Lithography, Feb. 2021 (Link)

8. Fast Prediction of Process Variation Band Through Machine Learning Models
   Pervaiz Kareem, Yonghwi Kwon, Gangmin Cho, and Youngsoo Shin
   SPIE Advanced Lithography, Feb. 2021 (Link)

9. Optimization of Accurate Resist Kernels Through Convolutional Neural Network
   Yonghwi Kwon and Youngsoo Shin
   SPIE Advanced Lithography, Feb. 2021 (Link)

10. Fast ECO Leakage Optimization Using Graph Convolutional Network (Best Paper Award candidate)
    Wonjae Lee, Yonghwi Kwon, and Youngsoo Shin
    ACM Great Lakes Symposium on VLSI (GLSVLSI), Aug. 2020 (Link)

11. Pre-layout Clock Tree Estimation and Optimization Using Artificial Neural Network
    Sunwha Koh, Yonghwi Kwon, and Youngsoo Shin
    ACM/IEEE International Symposium on Low Power Electronics and Design (ISLPED), Sep. 2020 (Link)

12. SRAF Printing Prediction Using Artificial Neural Network
    Yonghwi Kwon, Jinho Yang, Sungho Kim, Cheolkyun Kim, and Youngsoo Shin
    SPIE Advanced Lithography, Feb. 2020 (Link)

13. Clock Gating Synthesis of Netlist with Cyclic Logic Paths
    Yonghwi Kwon, Inhak Han, and Youngsoo Shin
    IEEE/ACM International Conference on Computer-Aided Design (ICCAD), Nov. 2019 (Link)

14. Optical Proximity Correction Using Bidirectional Recurrent Neural Network (BRNN)
    Yonghwi Kwon, Youngsoo Song, and Youngsoo Shin
    SPIE Advanced Lithography, Feb. 2019 (Link)

15. Transient Clock Power Estimation of Pre-CTS Netlist
    Yonghwi Kwon, Jinwook Jung, Inhak Han, and Youngsoo Shin
    IEEE International Symposium on Circuits and Systems (ISCAS), May 2018 (Link)

Patents

1. Machine Learning-Based Refragmentation Method and Apparatus for Optical Proximity Correction
   Youngsoo Shin, Gangmin Cho, Yonghwi Kwon, and Taeyoung Kim
   Korea Patent 10-2022-0109643

2. Method and Apparatus for Predicting Voltage Drop in Semiconductor Device
   Yonghwi Kwon, Youngsoo Shin, and Giyoon Jung
   Korea Patent 10-2021-0184730